- Research Areas
- Physico Mechanical Standards
- Electrical & Electronic Standards
- Time & Frequency Standards
- QHR Standards
- JVS & DC Current, Voltage & Resistance Standards
- DC High Voltage Standards
- AC Power and Energy Standards
- AC High Current & High Voltage Standards
- LF & HF Impedance Standards
- LF & HF Voltage, Current & RF Power Standards
- RF Attenuation & Impedance Standards
- Magnetic Standards
- Bio-Medical Standards
- Electronics & Instrumentation
- Engineering Materials
- Electronic Materials
- Materials Characterization
- Radio & Atmospheric Sciences
- Superconductivity and Cryogenics
- Support Units
- Institutional Repository
- Knowledge Resource Center
- Tenders
Electron Microscopy
Electron Microscopy
Transmission electron microscope at NPL is utilized as the central facility for the characterization of materials. Different types of samples in the form of thin films and powders prepared by various techniques have been received from different groups of NPL working on the development of new materials. These samples have been characterized for their particles shape, size, distribution of particles, phase identification etc., using transmission electron microscopy technique.

