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Testing Charges: Surface Analysis (SIMS)
Wed, 09/28/2011 - 12:01 — admin
| Testing Charges: Surface Analysis (SIMS) | ||||||||
| Sl. No. | Area of Testing | Sample / Item Name | Test Parameters | Sample Requirements, if any | Testing Charges per Sample Rs | Additional Charges Rs | Description of Additional Charges | Remarks, if any |
| 1 | Surface Analysis | Any Conducting / Semi-conducting material | SIMS Survey Scan Spectra | Samples should be in the form of thin films or thin pellets or wafers with smooth top surface; Size of the sample: Max.10x10x2 mm, Min. 5x5x1 mm | 12000 | 3000 | For Quantification if standard sample is supplied by NPL | Impurity Detection in ppm level |
| 2 | Surface Analysis | Any Conducting / Semi-conducting material | SIMS Depth Profile for Mono-Layer | Samples should be in the form of thin films or thin pellets or wafers with smooth top surface; Size of the sample: Max.10x10x2 mm, Min. 5x5x1 mm | 15000 | 3000 | For Quantification if standard sample is supplied by NPL | Depth resolution 2 to 3 nm |
| 3 | Surface Analysis | Any Conducting / Semi-conducting material | SIMS Depth Profile for Multi- Layer | Samples should be in the form of thin films with smooth top surface; Size of the sample: Max.10x10x2 mm, Min. 5x5x1 mm | 15000 | 3000 | For Quantification if standard sample is supplied by NPL | Depth resolution 2 to 3 nm |
| 4 | Surface Analysis | Any Conducting / Semi-conducting material | SIMS 2-D Chemical Imaging | Samples should be in the form of thin films or thin pellets or wafers with smooth top surface; Size of the sample: Max.10x10x2 mm, Min. 5x5x1 mm | 15000 | |||
| 5 | Surface Analysis | Any Conducting / Semi-conducting material | SIMS 3-D Chemical Imaging | Samples should be in the form of thin films or thin pellets or wafers with smooth top surface; Size of the sample: Max.10x10x2 mm, Min. 5x5x1 mm | 20000 | |||
